Joint X-ray and gamma-ray analysis at the photon level: Application to MSH 15-52

概要

Joint analysis of multi-wavelength (MWL) data at the level of photon events is challenging, but it provides a statistically preferable method of fitting the data, in contrast to fitting derived flux points. Data from X-ray and gamma-ray instruments are well-suited for a joint description, due to their common physical origin (same particle population and non-thermal processes) and incidentally also due to the high similarity of their formats. Such a description is especially desirable for objects…