X-ray Reflection as Diagnostic of Supermassive Black Hole Binary Properties

概要

We investigate correlations between prominent features in the relativistic X-ray reflection spectrum emitted by an accreting supermassive black hole (SMBH) binary with the underlying properties of the binary system. Model-independent measurements of the relativistic Fe K$α$ line ($\sim$6.4 keV) and the Compton reflection hump ($\sim$20-30 keV) are shown to be useful in constraining binary parameters. We compute 24,570 X-ray reflection spectra from two mini-disks attached to SMBHs at a fixed sepa…