A statistical hardness classification of ultraluminous X-ray sources using long-term Swift/XRT monitoring

Abstract

We characterize long-term hardness behavior in 29 ultraluminous X-ray sources (ULXs) using over 3500 archival Swift/XRT observations. We classify observations as soft-band dominated, hard-band dominated, or uncertain from the hardness ratio (HR; 1.5--10/0.3--1.5 keV count rates) and its confidence bounds. We derive $f_{\rm soft}$ and $f_{\rm hard}$ and define the Crossing Index (CI) as the fraction of consecutive confidently classified observations on opposite sides of $HR=1$. We analyze these d…